Way Kuo - Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development - Preis vom 21.02.2026 06:26:04 h
146.56 CHF
+ 4.99 CHF
Brand : Springer, Binding : Gebundene Ausgabe, Edition : 1998, Label : Springer, Publisher : Springer, NumberOfItems : 1, PackageQuantity : 1, Format : Illustriert, medium : Gebundene Ausgabe, numberOfPages : 420, publicationDate : 1998-01-31, releaseDate : 1998-01-31, authors : Way Kuo, Wei-Ting Kary Chien, Taeho Kim, ISBN : 0792381076 ...
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| Sold by | Item price | Delivery | Total price | |
|---|---|---|---|---|
| MEDIMOPS | 146.56 CHF | 4.99 CHF | 151.55 CHF |